“VLSI Design and Test for Systems Dependability” by T. Asai provides a comprehensive overview of the design and testing methodologies for Very Large Scale Integration (VLSI) systems with a focus on ensuring system dependability. Here’s a summary:
The book begins by introducing readers to the fundamental concepts of VLSI design, covering topics such as integrated circuit (IC) manufacturing processes, design abstraction levels, and system-on-chip (SoC) architectures. Asai lays the groundwork for understanding the complexities of designing reliable and dependable VLSI systems.
Readers are then introduced to various design-for-dependability techniques aimed at enhancing the reliability, availability, and maintainability of VLSI systems. These techniques include redundancy-based approaches, error detection and correction codes, fault tolerance mechanisms, and fault modeling methodologies.
A significant portion of the book is dedicated to VLSI testing methodologies for ensuring system reliability and dependability. Asai explores topics such as built-in self-test (BIST), scan-based testing, fault simulation, and design-for-testability (DFT) techniques, providing insights into the challenges and trade-offs involved in testing complex VLSI systems.
Furthermore, the book addresses advanced topics such as system-level fault tolerance, reliability modeling, and fault injection techniques for evaluating system dependability under different operating conditions.
Throughout the text, Asai emphasizes practical applications and design considerations, providing readers with real-world examples, case studies, and practical exercises to illustrate key concepts and techniques. The book also includes numerous references to recent research and industry developments in the field of VLSI design and test.
With its comprehensive coverage, theoretical insights, and practical applications, “VLSI Design and Test for Systems Dependability” serves as an invaluable resource for students, researchers, and professionals in the field of VLSI design, testing, and system reliability engineering. Whether used as a textbook for academic courses or as a reference for industry practitioners, this book provides a solid foundation in the theory and practice of designing dependable VLSI systems.